SEM SIRION 200

(Manager)

Facility/equipment: Equipment

John Anderson Building

Description

High vacuum field-emission gun scanning electron microscope (FEGSEM)

forescatter detector for electron channelling contrast imaging (ECCI) Medipix direct electron detector array for EBSD electrostatic beam blanker

Details

Name	SEM SIRION 200
Acquisition date	1/01/09
Manufacturers	FEI

Fingerprint

electron counters

high vacuum

field emission

electron microscopes

scanning electron microscopy

scanning

detectors

electrons

Contact information

Emails	r.w.martin@strath.ac.uk
Links	Website

Terms of loan/booking

Available for loan - internal and external

Related content

Research Output

Electron channelling contrast imaging for III-nitride thin film structures

Research output: Contribution to journal › Article

Characteristics of GaN-based light emitting diodes with different thicknesses of buffer layer grown by HVPE and MOCVD

Research output: Contribution to journal › Article

Spatially-resolved optical and structural properties of semi-polar (11-22) Al_xGa_1-xN with x up to 0.56

Research output: Contribution to journal › Article

Spatial clustering of defect luminescence centers in Si-doped low resistivity Al_0.82Ga_0.18N

Research output: Contribution to journal › Article

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Research output: Contribution to journal › Article

Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

Research output: Contribution to journal › Article

Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

Research output: Contribution to journal › Article

Generated carrier dynamics in V-pit enhanced InGaN/GaN light emitting diode

Research output: Contribution to journal › Article

Activities

Invited talk: mmc2019 EMAG, UK, July 2019 Title: Electron backscatter diffraction - exploring the structural properties of materials in the scanning electron microscope

Activity: Talk or presentation types › Invited talk

SPIE Photonics West 2020

Activity: Talk or presentation types › Invited talk

SPIE Photonics West 2017

Activity: Participating in or organising an event types › Key-note speaker and plenary lectures at conferences

Invited talk: 21st International Conference on Microscopy of Semiconducting Materials (MSM-XXI), UK, April 2019 Title: Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Activity: Talk or presentation types › Invited talk

Invited talk:EMAS 2019 - 16th European Workshop on Modern Developments and Applications in Microbeam Analysis, Norway, May 2019 Title: Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

Activity: Talk or presentation types › Invited talk

EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting

Activity: Participating in or organising an event types › Key-note speaker and plenary lectures at conferences

Invited talk:CAM-IES Workshop: Multi-Modal Characterisation of Energy Materials, UK, November 2019 Title: Investigating crystal structure, defects and luminescence from optoelectronic materials in the scanning electron microscope

Activity: Talk or presentation types › Invited talk

Datasets

Energy filtered electron backscatter diffraction patterns obtained using direct electron imaging

Dataset

Characteristics of GaN-based light emitting diodes with different thicknesses of buffer layer grown by HVPE and MOCVD

Dataset

Electron channelling contrast and cathodoluminescence images obtained from III-nitride layer structures

Dataset

Data for: Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

Dataset

Data for: "The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films"

Dataset

Data for: "Spatially-resolved optical and structural properties of semi-polar (11-22) Al_xGa_(1-x)N with x up to 0.56"

Dataset