Research output per year
Research output per year
Equipments Details
Description
High vacuum field-emission gun scanning electron microscope (FEGSEM)
forescatter detector for electron channelling contrast imaging (ECCI) Medipix direct electron detector array for EBSD electrostatic beam blankerDetails
| Name | SEM SIRION 200 |
|---|---|
| Acquisition date | 1/01/09 |
| Manufacturers | FEI |
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Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.
Research output
- 10 Article
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Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J., Enslin, J. & 17 others, , 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.Research output: Contribution to journal › Article › peer-review
Open AccessFile3 Citations (Scopus)7 Downloads (Pure) -
The 2020 UV emitter roadmap
Amano, H., Collazo, R., De Santi, C., Einfeldt, S., Funato, M., Glaab, J., Hagedorn, S., Hirano, A., Hirayama, H., Ishii, R., Kashima, Y., Kawakami, Y., Kirste, R., Kneissl, M., Martin, R., Mehnke, F., Meneghini, M., Ougazzaden, A., Parbrook, P. J., Rajan, S. & 16 others, , 15 Sep 2020, In: Journal of Physics D: Applied Physics. 53, 50, 57 p., 503001.Research output: Contribution to journal › Article › peer-review
Open AccessFile51 Citations (Scopus)8 Downloads (Pure)
Datasets
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Characteristics of GaN-based light emitting diodes with different thicknesses of buffer layer grown by HVPE and MOCVD
Edwards, P. (Creator), Martin, R. (Creator), McKendry, J. (Creator), Gu, E. (Creator) & Dawson, M. (Creator), University of Strathclyde, 14 Nov 2016
DOI: 10.15129/68e2f7a9-36ea-4598-a163-b8b440b593db
Dataset
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Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”
Trager-Cowan, C. (Creator), Alasmari, A. M. A. (Creator), Avis, W. (Contributor), Bruckbauer, J. (Creator), Edwards, P. (Contributor), Hourahine, B. (Contributor), Kraeusel, S. (Contributor), Kusch, G. (Creator), Johnston, R. (Contributor), Gunasekar, N. (Creator), Martin, R. (Contributor), Mohammad S, A. (Creator), Pascal, E. (Contributor), Spasevski, L. (Creator), Thomson, D. (Contributor), Vespucci, S. (Contributor), Parbrook, P. (Contributor), Smith, M. (Contributor), Enslin, J. (Contributor), Mehnke, F. (Contributor), Kneissl, M. (Contributor), Kuhn, C. (Contributor), Wernicke, T. (Contributor), Hagedorn, S. (Contributor), Knauer, A. (Contributor), Kueller, V. (Contributor), Walde, S. (Contributor), Weyers, M. (Contributor), Coulon, P. (Creator), Shields, P. (Contributor), Zhang, Y. (Contributor), Jiu, L. (Contributor), Gong, Y. (Contributor), Smith, R. M. (Contributor), Wang, T. (Contributor) & Winkelmann, A. (Creator), University of Strathclyde, 28 Oct 2019
DOI: 10.15129/b5238863-a088-4f30-8b13-2625260eb73a
Dataset
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International Workshop on Nitride Semiconductors
Robert Martin (Invited speaker)
23 Aug 2020 → 28 Aug 2020Activity: Talk or presentation types › Invited talk
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12th International Symposium on Semiconductor Light Emitting Devices
Robert Martin (Invited speaker)
10 May 2020 → 15 May 2020Activity: Talk or presentation types › Invited talk