Equipments Details
Description
Electron Backscatter Diffraction or EBSD is a scanning electron microscope based technique. Attached to our FE-SEM, the EBSD is used to analyse the crystallographic information about the microstructure of the sample.
This technique used for:
- Microstructure characterisation.
- Phase analysis; phase identification and quantification.
- Grain size measurement.
- Microtexture study
Details
| Name | Scanning Electron Microscope (SEM) |
|---|---|
| Acquisition date | 1/08/10 |
| Manufacturers | HITACHI |
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