Scanning Electron Microscope (SEM)

    Gerard Johnston (Manager)

Facility/equipment: Equipment

  • James Weir Building

Equipments Details

Description

Analysis types:

Morphological and topographical imaging Surface fractography Materials microstructure Material composition by backscattered electron (BSE) imaging Elemental analysis and mapping using energy dispersive spectroscopy (EDS) Variable pressure mode for non-conductive specimens – i.e. not possible carbon/gold coating Non-destructive analysis on big components due to a large chamber (300mm x 110mm) In-situ micro-mechanical uniaxial tests with a 2kN load cell and video capture Environmental capability with the Cryostage and Quantomix cells, for analyses on beam sensitive materials or hydrated samples (e.g. biological materials, plants, food products, emulsions, concretes, suspensions, lubricants, etc.).

Details

NameScanning Electron Microscope (SEM)
Acquisition date1/08/10
ManufacturersHitachi

Fingerprint Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.