Gerard Johnston (Manager)

Facility/equipment: Equipment

  • James Weir Building

Equipments Details


Suitable for qualitative and quantitative elemental analysis and depth profiling (up to 150μm) of conducting and non-conducting materials.

The GD-OES uses electron excitation, photon emission and a holographic grating to separate emitted light into its component wavelengths. This allows for measuring simultaneously multiple elements present in the analysed material including gaseous or carbon.

It sputters away material layer-by-layer and provides elemental information for:

Very thin layers Coated components Bulk materials


Acquisition date1/04/10

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