Field Emission SEM

    Gerard Johnston (Manager)

Facility/equipment: Equipment

  • James Weir Building

Description

Analysis Types:

Morphological and topographical imaging Surface fractography Materials microstructure Grain size and texture analysis by electron backscattered diffraction (EBSD) Material composition by backscattered electron (BSE) imaging Elemental analysis and mapping by means of energy dispersive spectroscopy (EDS) Wavelength dispersive spectroscopy (WDS) for concentrations ≤500ppm or element overlaps (e.g. Mo/S) Variable pressure mode for non-conductive specimens – i.e. when carbon/gold coating not possible Scanning transmission electron microscopy (STEM) on thin films

Details

NameField Emission SEM
Acquisition date1/08/10
ManufacturersHitachi

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Gold coatings
Wavelength dispersive spectroscopy
Electron diffraction
Field emission
Energy dispersive spectroscopy
Carbon
Textures
Transmission electron microscopy
Thin films
Scanning electron microscopy
Electrons
Chemical analysis