Field Emission SEM

Facility/equipment: Equipment

  • James Weir Building

Equipments Details

Description

Analysis Types:

Morphological and topographical imaging Surface fractography Materials microstructure Grain size and texture analysis by electron backscattered diffraction (EBSD) Material composition by backscattered electron (BSE) imaging Elemental analysis and mapping by means of energy dispersive spectroscopy (EDS) Wavelength dispersive spectroscopy (WDS) for concentrations ≤500ppm or element overlaps (e.g. Mo/S) Variable pressure mode for non-conductive specimens – i.e. when carbon/gold coating not possible Scanning transmission electron microscopy (STEM) on thin films

Details

NameField Emission SEM
Acquisition date1/08/10
ManufacturersHitachi

Fingerprint Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.