Description
Purpose
Used for structural and chemical analysis of metallographic specimens. Magnification up to x1,000,000 and down to a
resolution of 3nm
Specifications
— Scanning Electron Microscope (SEM) allows the observation microstructure in high magnification and superior resolution — Equipped with EBSD and EDX characterisation — Equipped with WDS/WDX — Electron Back-Scatter Diffraction (EBSD) for obtaining crystallographic information of materials — Energy-dispersive X-ray spectroscopy (EDS or EDX): analytical technique used for the elemental analysis or chemical characterizationDetails
| Name | FEI Quanta 250 FEG SEM |
|---|---|
| Acquisition date | 7/10/10 |
| Manufacturers | FEI |
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Energy dispersive spectroscopy
Electron microscopes
Scanning
Diffraction
Wavelength dispersive spectroscopy
Electrons
Chemical analysis
Structural analysis
Microstructure
X-Ray Emission Spectrometry