FEI Quanta 250 FEG SEM

    Margo Hutchison (Manager)

Facility/equipment: Equipment

  • Advanced Forming Research Centre

Equipments Details

Description

Purpose

Used for structural and chemical analysis of metallographic specimens. Magnification up to x1,000,000 and down to a
resolution of 3nm

Specifications

— Scanning Electron Microscope (SEM) allows the observation microstructure in high magnification and superior resolution — Equipped with EBSD and EDX characterisation — Equipped with WDS/WDX — Electron Back-Scatter Diffraction (EBSD) for obtaining crystallographic information of materials — Energy-dispersive X-ray spectroscopy (EDS or EDX): analytical technique used for the elemental analysis or chemical characterization

Details

NameFEI Quanta 250 FEG SEM
Acquisition date7/10/10
ManufacturersFEI

Fingerprint Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.

  • Research Output

    Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

    Naresh-Kumar, G., Thomson, D., Zhang, Y., Bai, J., Jiu, L., Yu, X., Gong, Y. P., Martin, R. S., Wang, T. & Trager-Cowan, C., 10 Aug 2018, In : Journal of Applied Physics. 124, 6, 6 p., 065301.

    Research output: Contribution to journalArticle

    Open Access
    File
  • 2 Citations (Scopus)
    11 Downloads (Pure)