FEI Quanta 250 FEG SEM

  • Margo Hutchison (Manager)

Facility/equipment: Equipment

  • Advanced Forming Research Centre

Equipments Details



Used for structural and chemical analysis of metallographic specimens. Magnification up to x1,000,000 and down to a
resolution of 3nm


— Scanning Electron Microscope (SEM) allows the observation microstructure in high magnification and superior resolution — Equipped with EBSD and EDX characterisation — Equipped with WDS/WDX — Electron Back-Scatter Diffraction (EBSD) for obtaining crystallographic information of materials — Energy-dispersive X-ray spectroscopy (EDS or EDX): analytical technique used for the elemental analysis or chemical characterization


NameFEI Quanta 250 FEG SEM
Acquisition date7/10/10


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