Research output per year
Research output per year
Equipments Details
Description
Electron probe microanalyser (EPMA) for WDX and cathodoluminescence (CL) analysis.
3× wavelength-dispersive X-ray (WDX) spectrometers cathodoluminescence (CL) hyperspectral imaging electron beam-induced current (EBIC)Details
| Name | CAMECA SX100 |
|---|---|
| Acquisition date | 1/01/01 |
| Manufacturers | CAMECA |
Fingerprint
Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.
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Correlation between deep-level defects and functional properties of β-(SnxGa1-x)2O3 on Si photodetectors
Hatipoglu, I., Hunter, D. A., Mukhopadhyay, P., Williams, M. S., Edwards, P. R., Martin, R. W., Schoenfeld, W. V. & Gunasekar, G. N., 28 Nov 2021, In: Journal of Applied Physics. 130, 20, 10 p., 204501.Research output: Contribution to journal › Article › peer-review
Open AccessFile7 Citations (Scopus)23 Downloads (Pure) -
Effects of selenisation temperature on photoluminescence and photoluminescence excitation spectra of ZnO/CdS/Cu2ZnSnSe4/Mo/glass
Sulimov, M. A., Yakushev, M. V., Márquez-Prieto, J., Forbes, I., Edwards, P. R., Zhivulko, V. D., Borodavchenko, O. M., Mudryi, A. V., Krustok, J. & Martin, R. W., 28 Feb 2019, In: Thin Solid Films. 672, p. 146-151 6 p.Research output: Contribution to journal › Article › peer-review
Open AccessFile1 Citation (Scopus)36 Downloads (Pure)
Datasets
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Data for: "Correlation between deep-level defects and functional properties of β-(SnxGa1-x)2O3 on Si photodetectors"
Gunasekar, N. (Creator), Martin, R. (Contributor), Edwards, P. (Contributor), Williams, M. (Contributor), Hunter, D. (Data Collector), Hatipoglu, I. (Data Collector), Mukhopadhyay, P. (Contributor) & Schoenfeld, W. (Contributor), University of Strathclyde, 9 Nov 2021
DOI: 10.15129/d2eaa892-20e9-4e60-9f4c-7169a245a449
Dataset
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SPIE Photonics West 2020
Martin, R. (Invited speaker)
1 Feb 2020 → 6 Feb 2020Activity: Talk or presentation types › Invited talk
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EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting
Martin, R. (Invited speaker)
7 May 2017 → 11 May 2017Activity: Participating in or organising an event types › Key-note speaker and plenary lectures at conferences