Simulations of X-ray emission spectra

Dataset

Description

Results of simulating X-ray emission spectra using NIST DTSA-II software, in order to investigate the influence of secondary fluorescence on the microanalysis of semiconductor layers. The methodology is outlined and the results analysed in the associated Microscopy and Microanalysis paper by D. A. Hunter et al. (2022).
Date made available10 May 2022
PublisherUniversity of Strathclyde
Date of data production2021

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