Energy filtered electron backscatter diffraction patterns obtained using direct electron imaging

Description

This dataset contains electron backscatter patterns (EBSPs) using a Medipix direct electron array detector. The figure numbers refer to those in the Physical Review B paper by Vespucci et al. associated with this dataset. Note that the images in Figures 1, 3 and 4 are saved in a 32-bit floating-point TIFF format, which may only be opened by scientific imaging software (such as ImageJ).

Date made available	2015
Publisher	University of Strathclyde

Contact

[email protected]

DOI
10.15129/7e864c9e-516c-465d-993d-b271f3698e1b

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Fig. 1 (b) - EBSP from GaN (5keV beam)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 3 (a) - EBSP from GaN (20keV beam, 19.4keV threshold, 0.5ms acquisition)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 3 (b) - EBSP from GaN (20keV beam, 19.4keV threshold, 1ms acquisition)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 3 (c) - EBSP from GaN (20keV beam, 19.4keV threshold, 5ms acquisition)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (a) - EBSP from diamond (20keV beam, 4.6keV threshold)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (b) - EBSP from Si (20keV beam, 4.6keV threshold)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (c) - EBSP from GaN (20keV beam, 4.6keV threshold)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (d) - EBSP from diamond (20keV beam, 19.4keV threshold)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (e) - EBSP from Si (20keV beam, 19.4keV threshold)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (f) - EBSP from GaN (20keV beam, 19.4keV threshold)
File: image/tiff, 256 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (g) - Dynamical simulation of EBSP from diamond (19.5keV)
File: image/tiff, 771 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (h) - Dynamical simulation of EBSP from Si (19.5keV)
File: image/tiff, 758 KB
Type: Image
Licence: CC BY 4.0
Fig. 4 (i) - Dynamical simulation of EBSP fromn GaN (19.5keV)
File: image/tiff, 771 KB
Type: Image
Licence: CC BY 4.0
Fig. 5 - Threshold energy calibration
File: application/vnd.openxmlformats-officedocument.spreadsheetml.sheet, 50.6 KB
Type: Dataset
Licence: CC BY 4.0
Fig. 8 (a) - EBSP from Si (30keV beam, 4.6eV threshold)
File: image/tiff, 64.1 KB
Type: Image
Licence: CC BY 4.0
Fig. 8 (b) - EBSP from Si (30keV beam, 28.6eV threshold)
File: image/tiff, 64.1 KB
Type: Image
Licence: CC BY 4.0

1 Article

Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns
Vespucci, S., Winkelmann, A., Naresh-Kumar, G., Mingard, K. P., Maneuski, D., Edwards, P. R., Day, A. P., O'Shea, V. & Trager-Cowan, C., 15 Nov 2015, In: Physical Review B (Condensed Matter). 92, 20, 9 p., 205301.
Research output: Contribution to journal › Article › peer-review

Open Access
File
53 Link opens in a new tab Citations (Scopus)

403 Downloads (Pure)

2 Finished

Direct electron imaging for electron backscatter diffraction and electron channelling contrast imaging
Trager-Cowan, C. (Principal Investigator)
National Physical Laboratory NPL
1/10/12 → 31/03/16
Project: Research - Studentship
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.
Trager-Cowan, C. (Principal Investigator), Gray, A. (Co-investigator) & Hourahine, B. (Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/07/12 → 30/06/16
Project: Research

SEM SIRION 200
Martin, R.
Physics
Facility/equipment: Equipment

Cite this

DataSetCite

Vespucci, S. (Creator), Gunasekar, N. (Creator), Edwards, P. (Creator), Trager-Cowan, C. (Creator) (2015). Energy filtered electron backscatter diffraction patterns obtained using direct electron imaging. University of Strathclyde. Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Fig(_.tif), Energy_calibration(.xlsx), Fig(_.tif), Fig(_.tif). 10.15129/7e864c9e-516c-465d-993d-b271f3698e1b

Energy filtered electron backscatter diffraction patterns obtained using direct electron imaging

Description

Contact

DOI

Access Dataset

Research output

Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

Projects

Direct electron imaging for electron backscatter diffraction and electron channelling contrast imaging

Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

Equipment

SEM SIRION 200

Cite this