Data resulting from the investigation of wide bandgap AlGaN:Si by wavelength dispersive X-Ray measurements

Research output

Research output per year 2017 2017

• 1 Article

Research output per year

Research output per year

Search results

• 2017

  Analysis of doping concentration and composition in wide bandgap AlGaN:Si by wavelength dispersive X-ray spectroscopy

  Kusch, G., Mehnke, F., Enslin, J., Edwards, P. R., Wernicke, T., Kneissl, M. & Martin, R. W., 13 Feb 2017, In: Semiconductor Science and Technology. 32, 3, 7 p., 035020.

  Research output: Contribution to journal › Article › peer-review

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  • aluminum gallium nitride
  • X-Ray Emission Spectrometry
  • Energy gap
  • Doping (additives)
  • Secondary ion mass spectrometry
  11 Citations (Scopus)

  121 Downloads (Pure)