Data resulting from the investigation of wide bandgap AlGaN:Si by wavelength dispersive X-Ray measurements

Gunnar Kusch (Creator)
Paul Edwards (Creator)
Robert Martin (Creator)

Dataset

1 Article

1 results

2017
Analysis of doping concentration and composition in wide bandgap AlGaN:Si by wavelength dispersive X-ray spectroscopy
Kusch, G., Mehnke, F., Enslin, J., Edwards, P. R., Wernicke, T., Kneissl, M. & Martin, R. W., 13 Feb 2017, In: Semiconductor Science and Technology. 32, 3, 7 p., 035020.
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