Data for: "The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films"

Dataset

Description

Scanning electron microscope images, electron channelling contrast micrographs, Electron backscatter diffraction data and cathodoluminescence data
Date made available28 Oct 2019
PublisherUniversity of Strathclyde
Date of data production4 Mar 2014 - 29 Jan 2019

Cite this

Trager-Cowan, C. (Creator), Alasmari, A. M. A. (Creator), Avis, W. (Contributor), Bruckbauer, J. (Creator), Edwards, P. (Contributor), Hourahine, B. (Contributor), Kraeusel, S. (Contributor), Kusch, G. (Creator), Johnston, R. (Contributor), Gunasekar, N. (Creator), Martin, R. (Contributor), Mohammad S, A. (Creator), Pascal, E. (Contributor), Spasevski, L. (Creator), Thomson, D. (Contributor), Vespucci, S. (Contributor), Parbrook, P. (Contributor), Smith, M. (Contributor), Enslin, J. (Contributor), Mehnke, F. (Contributor), Kneissl, M. (Contributor), Kuhn, C. (Contributor), Wernicke, T. (Contributor), Hagedorn, S. (Contributor), Knauer, A. (Contributor), Kueller, V. (Contributor), Walde, S. (Contributor), Weyers, M. (Contributor), Coulon, P. (Creator), Shields, P. (Contributor), Zhang, Y. (Contributor), Jiu, L. (Contributor), Gong, Y. (Contributor), Smith, R. M. (Contributor), Wang, T. (Contributor), Winkelmann, A. (Creator). (28 Oct 2019). Data for: "The scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films". University of Strathclyde. Figure_1_As_acquired_ECCI_micrograph(.TIF), Figure_2_a_SE_image(.bmp), Figure_2_c_Inset_as_acquired_ECCI_micrograph(.tif), Figure_2_c_Main_image_as_acquired_ECCI_micrograph(.tif), Figure_3_Raw_EBSD_patterns(p.001), Figure_3_StaticBackground_for_EBSD_patterns(.tiff), Figure_4_b_As_acquired_ECCI_micrograph(.tif), figure4c(.xlsx), figure4_CL_raw_data_set(.zip), Figure_4_e_As_acquired_ECCI_micrograph(.tif), figure4d_f_CL_GaN_intensity_image(.xlsx), Figure_5_c_As_acquired_ECCI_micorgraph(.TIF), Figure_5_d_Data_for_CL_NBE_emision_peak_height(.xlsx), Figure_5_e_As_acquired_backscattered_electron_topographic_image(.TIF), Figure_5_f_Data_for_CL_NBE_emision_peak_energy(.xlsx), Figure_6_a_Ga_level(.txt), Fig_6_Al_level(.txt), Figure_7_a_data(.txt), Figure_7_b_data(.txt). 10.15129/b5238863-a088-4f30-8b13-2625260eb73a