Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”

Carol Trager-Cowan (Creator)
Aeshah Mushabbab A Alasmari (Creator)
William Avis (Contributor)
Jochen Bruckbauer (Creator)
Paul Edwards (Contributor)
Ben Hourahine (Contributor)
Simon Kraeusel (Contributor)
Gunnar Kusch (Creator)
Ross Johnston (Contributor)
Naresh Gunasekar (Creator)
Robert Martin (Contributor)
Allehiani Mohammad S (Creator)
Elena Pascal (Contributor)
Lucia Spasevski (Creator)
David Thomson (Contributor)
Stefano Vespucci (Contributor)
Peter Parbrook (Contributor)
Matthew Smith (Contributor)
Johannes Enslin (Contributor)
Frank Mehnke (Contributor)
Michael Kneissl (Contributor)
C. Kuhn (Contributor)
Tim Wernicke (Contributor)
S. Hagedorn (Contributor)
A. Knauer (Contributor)
V. Kueller (Contributor)
S. Walde (Contributor)
M. Weyers (Contributor)
Pierre-Marie Coulon (Creator)
Philip Shields (Contributor)
Y. Zhang (Contributor)
L Jiu (Contributor)
Yipin Gong (Contributor)
Richard Martin Smith (Contributor)
T. Wang (Contributor)
Aimo Winkelmann (Creator)

Dataset

2 Article

2 results

2020
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J., Enslin, J. & 17 others, Mehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.
Research output: Contribution to journal › Article › peer-review

Open Access
File
1 Citation (Scopus)

5 Downloads (Pure)
2019
Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F. & 16 others, Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In: Photonics Research. 7, 11, p. B73-B82 10 p.
Research output: Contribution to journal › Article › peer-review

Open Access
File
6 Citations (Scopus)

2 Downloads (Pure)

Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”

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Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films