Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”

Carol Trager-Cowan (Creator)
Aeshah Mushabbab A Alasmari (Creator)
William Avis (Contributor)
Jochen Bruckbauer (Creator)
Paul Edwards (Contributor)
Ben Hourahine (Contributor)
Simon Kraeusel (Contributor)
Gunnar Kusch (Creator)
Ross Johnston (Contributor)
Naresh Gunasekar (Creator)
Robert Martin (Contributor)
Allehiani Mohammad S (Creator)
Elena Pascal (Contributor)
Lucia Spasevski (Creator)
David Thomson (Contributor)
Stefano Vespucci (Contributor)
Peter Parbrook (Contributor)
Matthew Smith (Contributor)
Johannes Enslin (Contributor)
Frank Mehnke (Contributor)
Michael Kneissl (Contributor)
C. Kuhn (Contributor)
Tim Wernicke (Contributor)
S. Hagedorn (Contributor)
A. Knauer (Contributor)
V. Kueller (Contributor)
S. Walde (Contributor)
M. Weyers (Contributor)
Pierre-Marie Coulon (Creator)
Philip Shields (Contributor)
Y. Zhang (Contributor)
L Jiu (Contributor)
Yipin Gong (Contributor)
Richard Martin Smith (Contributor)
T. Wang (Contributor)
Aimo Winkelmann (Creator)

Dataset

Description

Scanning electron microscope images, electron channelling contrast micrographs, Electron backscatter diffraction data and cathodoluminescence data

Date made available	28 Oct 2019
Publisher	University of Strathclyde
Date of data production	4 Mar 2014 - 29 Jan 2019

Contact

researchdataproject@strath.ac.uk

DOI
10.15129/b5238863-a088-4f30-8b13-2625260eb73a

Access Dataset

Figure_1_As_acquired_ECCI_micrograph.TIF
File: image/tiff, 1.32 MB
Type: Image
Licence: CC BY 4.0
Figure_2_a_SE_image.bmp
File: image/bmp, 301 KB
Type: Image
Licence: CC BY 4.0
Figure_2_c_Inset_as_acquired_ECCI_micrograph.tif
File: image/tiff, 3.7 MB
Type: Image
Licence: CC BY 4.0
Figure_2_c_Main_image_as_acquired_ECCI_micrograph.tif
File: image/tiff, 3.7 MB
Type: Image
Licence: CC BY 4.0
Figure_3_Raw_EBSD_patterns.zip.001
File: application/octet-stream, 5.89 GB
Type: Dataset
Licence: CC BY 4.0
Figure_3_StaticBackground_for_EBSD_patterns.tiff
File: image/tiff, 168 KB
Type: Image
Licence: CC BY 4.0
Figure_4_b_As_acquired_ECCI_micrograph.tif
File: image/tiff, 762 KB
Type: Image
Licence: CC BY 4.0
figure4c.xlsx
File: application/vnd.openxmlformats-officedocument.spreadsheetml.sheet, 35 KB
Type: Dataset
Licence: CC BY 4.0
figure4_CL_raw_data_set.zip
File: multipart/x-zip, 197 MB
Type: Dataset
Licence: CC BY 4.0
Figure_4_e_As_acquired_ECCI_micrograph.tif
File: image/tiff, 1.3 MB
Type: Image
Licence: CC BY 4.0
figure4d_f_CL_GaN_intensity_image.xlsx
File: application/vnd.openxmlformats-officedocument.spreadsheetml.sheet, 1.32 MB
Type: Dataset
Licence: CC BY 4.0
Figure_5_c_As_acquired_ECCI_micrograph.TIF
File: image/tiff, 4.77 MB
Type: Image
Licence: CC BY 4.0
Figure_5_d_Data_for_CL_NBE_emision_peak_height.xlsx
File: application/vnd.openxmlformats-officedocument.spreadsheetml.sheet, 344 KB
Type: Dataset
Licence: CC BY 4.0
Figure_5_e_As_acquired_backscattered_electron_topographic_image.TIF
File: image/tiff, 4.77 MB
Type: Image
Licence: CC BY 4.0
Figure_5_f_Data_for_CL_NBE_emision_peak_energy.xlsx
File: application/vnd.openxmlformats-officedocument.spreadsheetml.sheet, 340 KB
Type: Dataset
Licence: CC BY 4.0
Figure 6_a Ga_level.txt
File: text/plain, 192 KB
Type: Dataset
Figure 6_c_Al_level.txt
File: text/plain, 240 KB
Type: Dataset
Figure_7_a_data.txt
File: text/plain, 445 bytes
Type: Audiovisual
Figure_7_b_data.txt
File: text/plain, 15.9 KB
Type: Audiovisual

2 Article

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J., Enslin, J., & 17 othersMehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.
Research output: Contribution to journal › Article › peer-review

Open Access
File
4 Citations (Scopus)

12 Downloads (Pure)
Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J., Mehnke, F., & 16 othersKneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In: Photonics Research. 7, 11, p. B73-B82 10 p.
Research output: Contribution to journal › Article › peer-review

Open Access
File
8 Citations (Scopus)

10 Downloads (Pure)

3 Finished

Quantitative non-destructive nanoscale characterisation of advanced materials
Hourahine, B., Edwards, P., Roper, M., Trager-Cowan, C. & Gunasekar, N.
EPSRC (Engineering and Physical Sciences Research Council)
1/06/17 → 30/11/21
Project: Research
Manufacturing of nano-engineered III-nitride semiconductors
Martin, R. & Trager-Cowan, C.
EPSRC (Engineering and Physical Sciences Research Council)
1/05/15 → 30/09/21
Project: Research
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.
Trager-Cowan, C., Gray, A. & Hourahine, B.
EPSRC (Engineering and Physical Sciences Research Council)
1/07/12 → 30/06/16
Project: Research

ESEM Quanta 250
Robert Martin
Physics
Facility/equipment: Equipment
SEM SIRION 200
Robert Martin
Physics
Facility/equipment: Equipment

Cite this

Trager-Cowan, C. (Creator), Alasmari, A. M. A. (Creator), Avis, W. (Contributor), Bruckbauer, J. (Creator), Edwards, P. (Contributor), Hourahine, B. (Contributor), Kraeusel, S. (Contributor), Kusch, G. (Creator), Johnston, R. (Contributor), Gunasekar, N. (Creator), Martin, R. (Contributor), Mohammad S, A. (Creator), Pascal, E. (Contributor), Spasevski, L. (Creator), Thomson, D. (Contributor), Vespucci, S. (Contributor), Parbrook, P. (Contributor), Smith, M. (Contributor), Enslin, J. (Contributor), Mehnke, F. (Contributor), Kneissl, M. (Contributor), Kuhn, C. (Contributor), Wernicke, T. (Contributor), Hagedorn, S. (Contributor), Knauer, A. (Contributor), Kueller, V. (Contributor), Walde, S. (Contributor), Weyers, M. (Contributor), Coulon, P. (Creator), Shields, P. (Contributor), Zhang, Y. (Contributor), Jiu, L. (Contributor), Gong, Y. (Contributor), Smith, R. M. (Contributor), Wang, T. (Contributor), Winkelmann, A. (Creator) (28 Oct 2019). Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”. University of Strathclyde. Figure_1_As_acquired_ECCI_micrograph(.TIF), Figure_2_a_SE_image(.bmp), Figure_2_c_Inset_as_acquired_ECCI_micrograph(.tif), Figure_2_c_Main_image_as_acquired_ECCI_micrograph(.tif), Figure_3_Raw_EBSD_patterns(p.001), Figure_3_StaticBackground_for_EBSD_patterns(.tiff), Figure_4_b_As_acquired_ECCI_micrograph(.tif), figure4c(.xlsx), figure4_CL_raw_data_set(.zip), Figure_4_e_As_acquired_ECCI_micrograph(.tif), figure4d_f_CL_GaN_intensity_image(.xlsx), Figure_5_c_As_acquired_ECCI_micorgraph(.TIF), Figure_5_d_Data_for_CL_NBE_emision_peak_height(.xlsx), Figure_5_e_As_acquired_backscattered_electron_topographic_image(.TIF), Figure_5_f_Data_for_CL_NBE_emision_peak_energy(.xlsx), Figure_6_a_Ga_level(.txt), Fig_6_Al_level(.txt), Figure_7_a_data(.txt), Figure_7_b_data(.txt). 10.15129/b5238863-a088-4f30-8b13-2625260eb73a

Data for: “Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films”

Description

Contact

DOI

Access Dataset

Research output

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Projects

Quantitative non-destructive nanoscale characterisation of advanced materials

Manufacturing of nano-engineered III-nitride semiconductors

Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

Equipment

ESEM Quanta 250

SEM SIRION 200

Cite this