Description
GaN Stripes EBSD
Raw EBSD Data for a GaN thin film sample with changing polarities and crystal structures as published in:
Point-Group Sensitive Orientation Mapping Using EBSD. Winkelmann A., Nolze G., Himmerlich M., Lebedev V., Reichmann A. (2016) In: Holm E.A. et al. (eds) Proceedings of the 6th International Conference on Recrystallization and Grain Growth (ReX&GG 2016). Springer. The data was measured by G.Nolze, the sample was provided by V. Lebedev and M. Himmerlich
https://doi.org/10.1007/978-3-319-48770-0_41
The data in static_bam_ef.txt is a static EBSD background image (taken from a different experiment with the same detector)
This site includes records provided by Elsevier's Data Monitor product. University of Strathclyde does not control or guarantee the accuracy, relevance, or completeness of the information contained in such records and accepts no responsibility or liability for such information.
Raw EBSD Data for a GaN thin film sample with changing polarities and crystal structures as published in:
Point-Group Sensitive Orientation Mapping Using EBSD. Winkelmann A., Nolze G., Himmerlich M., Lebedev V., Reichmann A. (2016) In: Holm E.A. et al. (eds) Proceedings of the 6th International Conference on Recrystallization and Grain Growth (ReX&GG 2016). Springer. The data was measured by G.Nolze, the sample was provided by V. Lebedev and M. Himmerlich
https://doi.org/10.1007/978-3-319-48770-0_41
The data in static_bam_ef.txt is a static EBSD background image (taken from a different experiment with the same detector)
This site includes records provided by Elsevier's Data Monitor product. University of Strathclyde does not control or guarantee the accuracy, relevance, or completeness of the information contained in such records and accepts no responsibility or liability for such information.
Date made available | 12 Jan 2023 |
---|---|
Publisher | Zenodo |