Data for: "Point-Group Sensitive Orientation Mapping Using EBSD"

Dataset

Description

GaN Stripes EBSD
Raw EBSD Data for a GaN thin film sample with changing polarities and crystal structures as published in:

Point-Group Sensitive Orientation Mapping Using EBSD. Winkelmann A., Nolze G., Himmerlich M., Lebedev V., Reichmann A. (2016) In: Holm E.A. et al. (eds) Proceedings of the 6th International Conference on Recrystallization and Grain Growth (ReX&GG 2016). Springer. The data was measured by G.Nolze, the sample was provided by V. Lebedev and M. Himmerlich
https://doi.org/10.1007/978-3-319-48770-0_41

The data in static_bam_ef.txt  is a static EBSD background image (taken from a different experiment with the same detector)

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Date made available12 Jan 2023
PublisherZenodo

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