Data for: "Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction"

Kieran Hiller (Contributor)
Aimo Winkelmann (Contributor)
Ben Hourahine (Creator)
Bohdan Starosta (Contributor)
Aeshah Mushabbab A Alasmari (Contributor)
P. Feng (Contributor)
Tao Wang (Contributor)
Peter Parbrook (Contributor)
V. Z. Zubialevich (Contributor)
S. Hagedorn (Contributor)
S. Walde (Contributor)
Markus Weyers (Contributor)
P.-M. Coulon (Contributor)
Philip A. Shields (Contributor)
Carol Trager-Cowan (Supervisor)
Jochen Bruckbauer (Creator)

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2023
Imaging threading dislocations and surface steps in nitride thin films using electron backscatter diffraction
Hiller, K. P., Winkelmann, A., Hourahine, B., Starosta, B., Alasmari, A., Feng, P., Wang, T., Parbrook, P. J., Zubialevich, V. Z., Hagedorn, S., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Bruckbauer, J. & Trager-Cowan, C., 31 Dec 2023, In: Microscopy and Microanalysis. 29, 6, p. 1879-1888 10 p.
Research output: Contribution to journal › Article › peer-review

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