Data for: "Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction"

Kieran Hiller (Contributor)
Aimo Winkelmann (Contributor)
Ben Hourahine (Creator)
Bohdan Starosta (Contributor)
Aeshah Mushabbab A Alasmari (Contributor)
P. Feng (Contributor)
Tao Wang (Contributor)
Peter Parbrook (Contributor)
V. Z. Zubialevich (Contributor)
S. Hagedorn (Contributor)
S. Walde (Contributor)
Markus Weyers (Contributor)
P.-M. Coulon (Contributor)
Philip A. Shields (Contributor)
Carol Trager-Cowan (Supervisor)
Jochen Bruckbauer (Creator)

Dataset

1 Active
2 Finished

2 results

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Finished
Improving resolution and sensitivity for crystallographic analysis in the scanning electron microscope
Bruckbauer, J. (Principal Investigator)
Royal Society of Edinburgh
1/11/21 → 31/10/23
Project: Research
Quantitative non-destructive nanoscale characterisation of advanced materials
Hourahine, B. (Principal Investigator), Edwards, P. (Co-investigator), Roper, M. (Co-investigator), Trager-Cowan, C. (Co-investigator) & Gunasekar, N. (Research Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/06/17 → 30/11/21
Project: Research