Data for: "Imaging misorientation and strain of single dislocations in GaN using electron backscatter diffraction"

Jochen Bruckbauer (Creator)
Grzegorz Cios (Creator)

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1 Article

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2026
Imaging misorientation and strain of single dislocations in GaN using electron backscatter diffraction
Hiller, K. P., Cios, G., Winkelmann, A., Wheeler, J., Parbrook, P. J., Hourahine, B., Trager-Cowan, C. & Bruckbauer, J., 15 Jun 2026, In: Acta Materialia. 312, 13 p., 122185.
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