Data for: Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

Naresh Gunasekar (Creator)
David Thomson (Contributor)
zhang (Contributor)
J Bai (Contributor)
L Jiu (Contributor)
X Yu (Contributor)
y p Gong (Contributor)
Richard Martin Smith (Contributor)
Tao Wang (Contributor)
Carol Trager-Cowan (Contributor)

Dataset

1 Article

1 results

2018
Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging
Naresh-Kumar, G., Thomson, D., Zhang, Y., Bai, J., Jiu, L., Yu, X., Gong, Y. P., Martin, R. S., Wang, T. & Trager-Cowan, C., 10 Aug 2018, (E-pub ahead of print) In: Journal of Applied Physics. 124, 6, 6 p., 065301.
Research output: Contribution to journal › Article › peer-review

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7 Citations (Scopus)

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