Data for: Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging

  • Naresh Gunasekar (Creator)
  • David Thomson (Contributor)
  • zhang (Contributor)
  • J Bai (Contributor)
  • L Jiu (Contributor)
  • X Yu (Contributor)
  • y p Gong (Contributor)
  • Richard Martin Smith (Contributor)
  • Tao Wang (Contributor)
  • Carol Trager-Cowan (Contributor)

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