Data for: "Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope"

Description

Electron backscatter diffraction (EBSD) patterns and backscatter electron (BSE) intensity image derived from EBSD patterns, BSE and secondary electron (SE) images and cathodoluminescence (CL) hyperspectral images

Date made available	29 Apr 2019
Publisher	University of Strathclyde
Date of data production	21 May 2017 - 21 Jul 2017

Contact

[email protected]

DOI
10.15129/b152a121-3495-4235-b9cd-985bf1355cd8

Access Dataset

Supporting information Fig S2.tif
File: image/tiff, 0.98 MB
Type: Image
Licence: CC BY 4.0
Figure_1.tif
File: image/tiff, 338 KB
Type: Image
Licence: CC BY 4.0
Figure_2.tif
File: image/tiff, 2.97 MB
Type: Image
Licence: CC BY 4.0
Figure_3.tif
File: image/tiff, 386 KB
Type: Image
Licence: CC BY 4.0
Figure_4.tif
File: image/tiff, 1 MB
Type: Image
Licence: CC BY 4.0
Map_Data_1.ctf
File: application/octet-stream, 8.87 MB
Type: Dataset
Licence: CC BY 4.0
figure5.xlsx
File: application/vnd.openxmlformats-officedocument.spreadsheetml.sheet, 202 KB
Type: Dataset
Licence: CC BY 4.0
figureS3.tif
File: image/tiff, 954 KB
Type: Image
Licence: CC BY 4.0
figureS4.xlsx
File: application/vnd.openxmlformats-officedocument.spreadsheetml.sheet, 1.59 MB
Type: Image
Licence: CC BY 4.0
RAW_EBSD_patterns.zip
File: multipart/x-zip, 21.7 GB
Type: Dataset
Licence: CC BY 4.0
CL_raw_data.zip
File: multipart/x-zip, 121 MB
Type: Dataset
Licence: CC BY 4.0
Angle_resolved_backscattered_electron_data_contains_h5_file.zip
File: multipart/x-zip, 11.8 MB
Type: Dataset
Licence: CC BY 4.0

3 Article

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Ferenczi, G., Hourahine, B., Kotzai, A., Kraeusel, S., Kusch, G., Martin, R. W., McDermott, R., Gunasekar, N., Nouf-Allehiani, M., Pascal, E., Thomson, D., Vespucci, S., Smith, M. D., Parbrook, P. J. & Enslin, J. & 17 others, Mehnke, F., Kuhn, C., Wernicke, T., Kneissl, M., Hagedorn, S., Knauer, A., Walde, S., Weyers, M., Coulon, P.-M., Shields, P., Bai, J., Gong, Y., Jiu, L., Zhang, Y., Smith, R., Wang, T. & Winkelmann, A., 25 Mar 2020, In: Semiconductor Science and Technology. 35, 5, 15 p., 054001.
Research output: Contribution to journal › Article › peer-review

Open Access
File
7 Citations (Scopus)

39 Downloads (Pure)
Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films
Trager-Cowan, C., Alasmari, A., Avis, W., Bruckbauer, J., Edwards, P. R., Hourahine, B., Kraeusel, S., Kusch, G., Johnston, R., Naresh-Kumar, G., Martin, R. W., Nouf-Allehiani, M., Pascal, E., Spasevski, L., Thomson, D., Vespucci, S., Parbrook, P. J., Smith, M. D., Enslin, J. & Mehnke, F. & 16 others, Kneissl, M., Kuhn, C., Wernicke, T., Hagedorn, S., Knauer, A., Kueller, V., Walde, S., Weyers, M., Coulon, P.-M., Shields, P. A., Zhang, Y., Jiu, L., Gong, Y., Smith, R. M., Wang, T. & Winkelmann, A., 30 Oct 2019, In: Photonics Research. 7, 11, p. B73-B82 10 p.
Research output: Contribution to journal › Article › peer-review

Open Access
File
9 Citations (Scopus)

34 Downloads (Pure)
Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope
Naresh-Kumar, G., Bruckbauer, J., Winkelmann, A., Yu, X., Hourahine, B., Edwards, P. R., Wang, T., Trager-Cowan, C. & Martin, R. W., 12 Jun 2019, In: Nano Letters. 19, 6, p. 3863-3870 8 p.
Research output: Contribution to journal › Article › peer-review

Open Access
File
15 Citations (Scopus)

42 Downloads (Pure)

2 Finished

Quantitative non-destructive nanoscale characterisation of advanced materials
Hourahine, B. (Principal Investigator), Edwards, P. (Co-investigator), Roper, M. (Co-investigator), Trager-Cowan, C. (Co-investigator) & Gunasekar, N. (Research Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/06/17 → 30/11/21
Project: Research
Manufacturing of nano-engineered III-nitride semiconductors
Martin, R. (Principal Investigator) & Trager-Cowan, C. (Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/05/15 → 30/09/21
Project: Research

ESEM Quanta 250
Martin, R.
Physics
Facility/equipment: Equipment

Cite this

Gunasekar, N. (Creator), Bruckbauer, J. (Creator), Winkelmann, A. (Contributor), Edwards, P. (Contributor), Hourahine, B. (Contributor), Trager-Cowan, C. (Contributor), Martin, R. (Supervisor), Wang, T. (Creator) (29 Apr 2019). Data for: "Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope". University of Strathclyde. supporting_fig_3(.tif), Figure_1(.tif), Figure_2(.tif), Figure_3(.tif), Figure_4(.tif), Map_Data_1(.ctf), figure5(.xlsx), figureS3(.tif), figureS4(.xlsx), RAW_EBSD_patterns(.zip), CL_raw_data(.zip), Angle_resolved_backscattered_electron_data_contains_h5_file(.zip). 10.15129/b152a121-3495-4235-b9cd-985bf1355cd8

Data for: "Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope"

Description

Contact

DOI

Access Dataset

Research output

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Scanning electron microscopy as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Determining GaN nanowire polarity and its influence on light emission in the scanning electron microscope

Projects

Quantitative non-destructive nanoscale characterisation of advanced materials

Manufacturing of nano-engineered III-nitride semiconductors

Equipment

ESEM Quanta 250

Cite this