Cathodoluminescence and wavelength-dispersive X-ray measurements of InAlGaN



This data is the result of cathodoluminescence hyperspectral imaging and wavelength-dispersive X-ray measurements carried out on a set of InAlGaN epilayers, grown at the Technische Universität Berlin using a range of different precursor fluxes. Details of the samples are given in Sample_details.txt, details of the measurements in Measurement_details.txt, and a description of the proprietary cathodoluminescence file format in File_formats.txt.

Further analysis and interpretation of this data is presented in the associated journal article, and figure numbers referred to in the data correspond to those used in this paper:
G. Kusch et al.,"Influence of InN and AlN concentration on the compositional inhomogeneity and formation of InN-rich regions in InxAlyGa1-x-yN", Jap. J. Appl. Phys. (2019).
Date made available14 Mar 2019
PublisherUniversity of Strathclyde
Date of data production2018

Cite this

Kusch, G. (Creator), Spasevski, L. (Creator), Edwards, P. (Creator), Martin, R. (Creator). (14 Mar 2019). Cathodoluminescence and wavelength-dispersive X-ray measurements of InAlGaN. University of Strathclyde. CL_and_WDX_data_from_InAlGaN(.zip). 10.15129/e63d2ae4-91a9-4c55-9836-52f8793a3cf6