Atomic-scale characterization of occurring phenomena during hot nanometric cutting of single crystal 3C-SiC

Saeed Zare Chavoshi (Creator)
Xichun Luo (Supervisor)

Design, Manufacturing And Engineering Management

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2016
Atomic-scale characterization of occurring phenomena during hot nanometric cutting of single crystal 3C-SiC
Zare Chavoshi, S. & Luo, X., 27 Jul 2016, In: RSC Advances. 6, 75, p. 71409-71424 16 p.
Research output: Contribution to journal › Article › peer-review

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