Atomic-scale characterization of occurring phenomena during hot nanometric cutting of single crystal 3C-SiC

  • Saeed Zare Chavoshi (Creator)
  • Xichun Luo (Supervisor)

Dataset

Description

Stress data, created by MS Word 2010
Date made available28 Feb 2017
PublisherUniversity of Strathclyde

Cite this

Zare Chavoshi, S. (Creator), Luo, X. (Supervisor). (28 Feb 2017). Atomic-scale characterization of occurring phenomena during hot nanometric cutting of single crystal 3C-SiC. University of Strathclyde. RSC_3C_SiC(.docx). 10.15129/16093753-4ad7-4035-8e99-d2974a55c8fc