ToF-SIMS imaging of amorphous solid dispersions: a stability study

Paladino, E. (Speaker), Doerr, F. (Contributor), Onyemelukwe, I. I. (Contributor), Ian Gilmore (Contributor), Halbert, G. (Contributor)

Activity: Talk or presentation typesOral presentation

Description

Talk - awarded with best presentation prize
Period23 Oct 2019
Held at22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22)
Event typeConference
LocationKyoto, Japan