SPIE Optical Metrology

Stoliarskaia, D. (Speaker), Thomson, K. (Participant), Lue, L. (Participant), Chen, Y. (Participant)

Activity: Participating in or organising an event typesParticipation in conference

Period24 Jun 2019 - 27 Jun 2019
Event typeConference
LocationMunich, Germany
Degree of RecognitionInternational