Plenary talk: XVIIIth International Conference on Electron Microscopy, Zakopane, Poland, June 2024. Pushing the Limits of Diffraction Imaging in the Scanning Electron microscope for the Structural Characterisation of Semiconductor thin Films and Microstructures

Trager-Cowan, C. (Invited speaker)
Bruckbauer, J. (Contributor)
Hiller, K. (Contributor)
Hourahine, B. (Contributor)
McDermott, R. (Contributor)
Dale Waters (Contributor)
Aeshah Mushabbab A Alasmari (Contributor)
Naresh Gunasekar (Contributor)
Grzegorz Cios (Contributor)
Winkelmann, A. (Contributor)

Activity: Talk or presentation types › Invited talk

Period	10 Jun 2024
Event title	XVIIIth International Conference on Electron Microscopy
Event type	Conference
Location	Zakopane, PolandShow on map
Degree of Recognition	International

Documents & Links

https://em2024.pl/

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