Invited talk:EMAS 2019 - 16th European Workshop on Modern Developments and Applications in Microbeam Analysis, Norway, May 2019 Title: Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

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• Projects

• Quantitative non-destructive nanoscale characterisation of advanced materials

  Project: Research

• Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

  Project: Research

• Manufacturing of nano-engineered III-nitride semiconductors

  Project: Research

• Doctoral Training Partnership (DTP 2016-2017 University of Strathclyde) | McDermott, Ryan

  Project: Research Studentship - Internally Allocated

• Nanoanalysis for Advanced Materials and Healthcare - EPSRC strategic equipment

  Project: Research

• Equipment

• SEM SIRION 200

  Facility/equipment: Equipment