Invited talk: The Royal Microscopical Society Electron Backscatter Diffraction Conference, UK, April 2019 Title: Visualisation and investigation of defects using electron channelling (electron diffraction) in the scanning electron microscope.

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• Manufacturing of nano-engineered III-nitride semiconductors

  Project: Research

• Quantitative non-destructive nanoscale characterisation of advanced materials

  Project: Research

• Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.

  Project: Research

• Doctoral Training Partnership (DTP 2016-2017 University of Strathclyde) | McDermott, Ryan

  Project: Research Studentship - Internally Allocated

• Nanoanalysis for Advanced Materials and Healthcare - EPSRC strategic equipment

  Project: Research