Invited talk: International Workshop on Nitride Semiconductor, Japan, November 2018 Title: Visualization and investigation of defects using electron channeling (electron diffraction) in the scanning electron microscope

Activity: Talk or presentation types › Invited talk

Period14 Nov 2018
Event titleInvited talk: International Workshop on Nitride Semiconductor, Japan, November 2018 Title: Visualization and investigation of defects using electron channeling (electron diffraction) in the scanning electron microscope
Event typeConference
LocationKanazawa, JapanShow on map
Degree of RecognitionInternational

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