Invited talk: International Workshop on Nitride Semiconductor, Japan, November 2018 Title: Visualization and investigation of defects using electron channeling (electron diffraction) in the scanning electron microscope

Activity: Talk or presentation typesInvited talk

Period14 Nov 2018
Held atInvited talk: International Workshop on Nitride Semiconductor, Japan, November 2018 Title: Visualization and investigation of defects using electron channeling (electron diffraction) in the scanning electron microscope
Event typeConference
LocationKanazawa, Japan
Degree of RecognitionInternational