Invited talk: Gordon Research Conference on Defects in Semiconductors, New London, US, August 2018 Title: Investigating the Structural and Luminescence Properties of Semiconductors in the Scanning Electron Microscope

Activity: Talk or presentation types › Invited talk

Period22 Aug 2018
Event titleInvited talk: Gordon Research Conference on Defects in Semiconductors, New London, US, August 2018 Title: Investigating the Structural and Luminescence Properties of Semiconductors in the Scanning Electron Microscope
Event typeConference
LocationNew London, United StatesShow on map
Degree of RecognitionInternational

Related content