Invited talk at the Microscopy and Microanalysis Conference, Hartford, USA, August 2014. Title: Defect Imaging in the Scanning Electron Microscope - Electron Channelling Contrast Imaging of defects in III-nitride semiconductors

Trager-Cowan, C. (Invited speaker)

Activity: Participating in or organising an event typesParticipation in conference

Description

Invited talk: Microscopy and Microanalysis, Hartford 2014
PeriodAug 2014
Event typeConference
LocationHartford, United States