Invited talk at the Extended Defects in Semiconductors Conference, Gottingen, Germany, September 2014. Title: Electron Channelling Contrast Imaging of Extended Defects

Trager-Cowan, C. (Invited speaker)

Activity: Participating in or organising an event typesParticipation in conference

Description

Invited talk: Extended Defects in Semiconductors Conference
PeriodSep 2014
Event typeConference
LocationGottingen, Germany