Invited talk: 21st International Conference on Microscopy of Semiconducting Materials (MSM-XXI), UK, April 2019 Title: Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Activity: Talk or presentation typesInvited talk

Period12 Apr 2019
Event title21st International Conference on Microscopy of Semiconducting Materials
Event typeConference
LocationCambridge, United Kingdom
Degree of RecognitionInternational