Invited Talk: 12th International Conference on Nitride Semiconductors, Strasbourg, France, July, 2017 Title: Novel scanning electron microscopy techniques for rapid structural characterisation of III-N films.

Activity: Talk or presentation typesInvited talk

PeriodJul 2017
Held at12th International Conference on Nitride Semiconductors (ICNS-12)
Event typeConference
LocationStrasbourg, France
Degree of RecognitionInternational