Evaluation of Deep Learning methods for particle characterisation from in-line imaging and chord length distribution measurements

Activity: Talk or presentation typesOral presentation

Period18 Sept 2022
Event title9th World Congress on Particle Technology: Exploring beyond limits
Event typeConference
LocationMadrid, SpainShow on map
Degree of RecognitionInternational

Keywords

  • deep learning
  • particle characterisation
  • chord length distribution
  • image analysis