Characterization of threading dislocations in nitrides by modelling contrast profiles observed in electron channelling contrast images

  • Elena Pascal (Speaker)

Activity: Talk or presentation types › Oral presentation

Period30 Jun 2017 → 4 Jul 2017
Event titleInternational Conference of Defects in Semiconductors
Event typeConference
Conference number29
LocationMatsue, JapanShow on map
Degree of RecognitionInternational

Documents & Links

  • ICDS2017

    File: application/pdf, 20.9 MB

    Type: Audiovisual

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