2nd Workshop on Cathodoluminescence and Electron Beam Induced Current of Semiconductor Nanostructures

Bruckbauer, J. (Invited speaker)

Activity: Participating in or organising an event typesParticipation in workshop, seminar, course

Description

Defect characterisation combining cathodoluminescence and diffraction techniques in the SEM
PeriodMar 2020
Event typeConference
LocationGrenoble, France
Degree of RecognitionInternational