13th International Conference on Nitride Semiconductors (ICNS-13)

Activity: Participating in or organising an event typesParticipation in conference


Talk 1: Luminescence and defect imaging in semi-polar InGaN/GaN ‘bow-tie’ structures on patterned Si substrates
Talk 2: Investigating the Structural Properties of AlN Thin Films Grown on Nano-Patterned Sapphire Substrates in the Scanning Electron Microscope
Poster: Investigation of hexagonal inclusions in zincblende GaN using cathodoluminescence and electron backscatter diffraction in the SEM
Period7 Jul 201912 Jul 2019
Event typeConference
Conference number13
LocationSeattle, United States, WashingtonShow on map
Degree of RecognitionInternational